Semiconductor Characterization Techniques and Applications Certificate
Unlock the tools that reveal how semiconductor devices really work. This course equips engineers and technical professionals with practical semiconductor characterization techniques—from electrical measurements to beam, optical, and X-ray analysis—so they can diagnose materials, evaluate device performance, and support real-world manufacturing, reliability, and process decisions.
$799
Total: Course cost
25-35 Hours to complete
5 modules
Online - self-paced
Learning modality
Earn a credential
View credential
$799
Total: Course cost
25-35 Hours to complete
5 modules
Online - self-paced
Learning modality
Earn a credential
View credential
$799
Total: Course cost
25-35 Hours to complete
5 modules
Online - self-paced
Learning modality
Earn a credential
View credential
$799
Total: Course cost
25-35 Hours to complete
Duration
Online - self-paced
Overview
This course provides a comprehensive, application-focused introduction to semiconductor characterization techniques used to evaluate materials and devices. Learners progress from core semiconductor physics to hands-on electrical, beam-based, optical, and X-ray methods, gaining practical insight into how measurements inform device performance, reliability, and manufacturing process decisions.
Emphasis is placed on interpreting measurement data to support engineering analysis, diagnose issues, and guide decisions across research, development, and production environments.
Expert-Led Live Session
As part of this course, learners are invited to attend a live, online session featuring instructor-led discussion, industry standard CAD tools, and Q&A. Attendance is optional, and a recording will be available for those unable to join live.
- October 15, 2026 (10:00 am AZ Time)
This session brings key course concepts to life by revisiting semiconductor fundamentals, including P–N junction diodes, MOS capacitors, and diode I–V behavior. Through guided Technology CAD (TCAD) simulation, participants will see how device physics translates into practice, with visualizations of energy band diagrams and I–V/C–V characteristics that deepen understanding of real-world semiconductor behavior.
Students are encouraged (though not required) to have worked on Modules 1 and 2 before joining the session.
Key Benefits
- Understand and analyze the electrical behavior of diodes and MOS-based devices
- Apply multiple semiconductor characterization techniques to real-world engineering scenarios
- Distinguish among electrical, beam, optical, and X-ray methods and their appropriate use cases
- Interpret measurement data to evaluate material properties and device performance
What’s Included
- Five structured modules covering foundational and advanced semiconductor characterization techniques
- Case-study projects simulating semiconductor processing, device performance, and reliability challenges
- Knowledge checks and assessments reinforcing applied measurement and data interpretation concepts”
- Step-by-step instruction using industry-relevant and research-grade characterization tools
By the end of the course, you’ll be prepared to analyze semiconductor materials and devices with confidence using modern characterization techniques.
Course Modules
Who this course is designed for
-
Engineering students, early-career semiconductor professionals, and technicians seeking practical experience in device and materials characterization
-
Individuals pursuing roles in semiconductor manufacturing, process engineering, device engineering, or materials analysis
-
Learners aiming to build hands-on measurement skills and strengthen data interpretation abilities
-
Those looking to develop fluency with industry-standard and research-based characterization techniques
Outcomes
By the end of this course, you’ll be able to:
-
Identify and analyze key characteristics of CMOS materials and devices using appropriate measurement techniques
-
Apply semiconductor characterization methods to real-world device, materials, and process evaluation scenarios
-
Distinguish among electrical, beam-based, optical, and X-ray characterization techniques and select appropriate methods for specific applications
Program support
Have additional questions?
Please reach out directly to exec-fseonline@asu.edu for program related questions.
Connect with our team
Complete a brief form to get program recommendations and answers to your questions.